The Optics and Imaging Systems (OIS) Group of Singapore Institute of Manufacturing Technology (SIMTech) is seeking a highly self‑motivated scientist or senior scientist to drive, initiate, and lead R&D on novel X‑ray inspection technologies, systems, and applications for internal defects detection with advanced semiconductor packaging.

The candidate will play a leading role in understanding the challenges that the semiconductor industry is facing today for internal defects inspection, exploring and proposing novel R&D topics on X‑ray inspection and metrology technologies, and translating R&D IPs to novel industrial solutions and semiconductor equipment.

• Novel nano‑X‑ray inspection technology/system for Semiconductor Manufacturing
• Science for X‑ray interaction with materials and its impact on X‑ray 2D imaging and CT reconstruction
• AI‑assisted defects/ar...