Define and implement NAND Flash reliability test flows to assess product reliability performance and prevent extrinsic/intrinsic reliability escapes.
Perform high‑volume statistical data analysis to evaluate NAND DPM/ intrinsic reliability risks and trends.
Drive electrical failure analysis, including advance characterization, to identify root causes and solution spaces.
Develop short‑term countermeasures such as targeted stresses and screens, applying knowledge of digital/analog circuits, device physics, and process engineering.
Qualify the product with innovative control measures to provide best in Class DPM and Cell reliability.
Collaborate closely with Fab, NAND Technology, NAND Design, Product Development, System Development, and Quality/Reliability teams to develop solutions and enable shipment of high‑quality end products.
Integrates AI‑assisted tools and insights into daily work to improve...
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